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When simulating an entire microscope, we need to be able to trace an electron through multiple elements. The most obvious approach to achieve this would be to define a new SystemTracer which accepts multiple fields. Translation and rotations of the fields inside the 'global' coordinate system should be supported.
The text was updated successfully, but these errors were encountered:
When simulating an entire microscope, we need to be able to trace an electron through multiple elements. The most obvious approach to achieve this would be to define a new
SystemTracer
which accepts multiple fields. Translation and rotations of the fields inside the 'global' coordinate system should be supported.The text was updated successfully, but these errors were encountered: